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| Home >> High Reliability Testing Programme |
| High Reliability Testing Programme |
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Isocom Limited's high reliability test programme is designed to evaluate on a regular basis the continued integrity of our products. Additionally, depending upon customer needs, 100% screening including burn-in under specified conditions can be offered.
Isocom Limited's reliability programme embraces all of the following activities:
- Product Design
- Product Evaluation and Qualification
- Material Purchase
- Production Quality and Process Control
- Interim and Final Testing
- Screening (if required)
- Lot-By-Lot Quality Conformance Test
- Periodic Environmental and Quality Assessment Testing (Groups A, B & D)
- Defect Analysis and Feedback
- Strong Customer Interface
100% Screening Options
Typical 100% screening options to meet IECQ-CECC requirements are shown below.
| TEST |
CONDITIONS |
L2 |
L3 |
L4 |
| Internal Visual Examination |
Condition "B" |
Y |
Y |
- |
| High Temp Storage |
24h @ + 150°C |
Y |
Y |
- |
| Temp. Cycle |
-65°C/+150°C, 10 cycles |
Y |
Y |
- |
| Constant Acceleration |
49,000 m/s2 (5000 g), Y1 axis, 1 minute |
Y |
Y |
- |
| Fine Leak |
Tracer gas (helium) - test Qk |
Y |
Y |
- |
| Gross Leak |
Fluorocarbon bubble method - test Qc |
Y |
Y |
- |
| Pre-burn in Electrical test |
As detail spec |
Y |
- |
Y |
| Burn-in |
160 h (min) at +125°C (as detail spec) |
Y |
- |
Y |
| Post burn-in electrical |
As detail spec |
Y |
- |
Y |
| PDA calculation |
Percent defects allowed - as specified (typically 5% or 10%) |
Y |
- |
Y |
| Final Electrical Tests |
Static characteristics at -55°C, +25°C, +125°C.
Dynamic characteristics at 25°C |
Y |
Y |
Y |
| External visual inspection |
As detail spec |
Y |
Y |
Y |
Reliability Data
Isocom Limited is constantly assessing the reliability of its products through device qualification, quality conformance testing and supplementary life testing.
The co-ordinated programme of activities is aimed at ensuring the integrity of each constituent element as well as the whole device. Parameters key to long term stability have been identified as:
Input LED:
Power output, forward voltage, reverse leakage.
Output phototransistor:
Responsivity (quantum efficiency), gain, forward and reverse voltage characteristics.
Integrated output detector:
Responsivity, gain, supply current, leakage current.
Total device:
Current transfer ratio, isolation leakage, interconnections.
High temperature endurance data illustrates the long term stability of Isocom Limited's optocouplers.
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Exhibitions
